Quantitative aspects of ion scattering spectroscopy
Author:
Publisher
Wiley
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry
Reference14 articles.
1. Surface analysis with low energy ion scattering
2. Theory of Auger Ejection of Electrons from Metals by Ions
3. Neutralisation behavior in scattering of low energy ions from solid surfaces
4. Emploi quantitatif de la spectroscopie Auger; Étalonnage de la méthode
5. Quantitative aspects of Ion Scattering Spectroscopy (ISS)
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1. XPS and ISS study of NiTiO3and PbTiO3subjected to low-energy ion bombardment. I. Influence of the type of ion (Ar+and O 2+);Surface and Interface Analysis;1993-11
2. Synthetic Polymer Adhesives;Comprehensive Polymer Science and Supplements;1989
3. Analysis of surface structures in nitrogen-containing polymer systems by ion scattering spectroscopy;Macromolecules;1987-09
4. Ion scattering spectroscopy studies of zirconium dioxide thin films preparedin situ;Surface and Interface Analysis;1987-02
5. Practical surface analysis: state of the art and recent developments in AES, XPS, ISS and SIMS;Surface and Interface Analysis;1986-07
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