Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging-Reference-Cited by-同舟云学术

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Multifrequency Imaging in the Intermittent Contact Mode of Atomic Force Microscopy: Beyond Phase Imaging

Published:2012-02-15 Issue:8 Volume:8 Page:1264-1269
ISSN:1613-6810
Container-title:Small
language:en
Short-container-title:Small

Author:

Guo Senli,Solares Santiago D.,Mochalin Vadym,Neitzel Ioannis,Gogotsi Yury,Kalinin Sergei V.,Jesse Stephen

Publisher

Wiley

Subject

Biomaterials,Biotechnology,General Materials Science,General Chemistry

Reference40 articles.

1. M. F. Finlan I. A. McKay US Patent 1990

2. Bistable behavior of a vibrating tip near a solid surface

3. V. B. Elings J. Gurley US Patent 1992

4. Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy

5. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity

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