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Extended x-ray emission fine structure and high-energy satellite lines state measured by electron probe microanalysis

  • Published:2001 Issue:2 Volume:31 Page:118-125
  • ISSN:0142-2421
  • Container-title:Surface and Interface Analysis
  • language:en
  • Short-container-title:Surf. Interface Anal.

Author:

Takahashi Hideyuki,Harrowfield Ian,MacRae Colin,Wilson Nick,Tsutsumi Kenichi

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Cited by 6 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. KMMRAE structure and Sawada lines of Co, Ni, Cu, Zn and Ga;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2019-06

2. Electron-beam (5-10 keV) damage in triplite-group phosphates: Consequences for electron-microprobe analysis of fluorine;American Mineralogist;2006-04-01

3. Radiative Auger Effect and Extended X-Ray Emission Fine Structure (EXEFS);Analytical Sciences;2005

4. Fluorine K? x-ray fluorescence spectra of LuF3 and NaF using synchrotron radiation;Surface and Interface Analysis;2005

5. Electron Microscopy in Mineral Processing;Industrial Applications Of Electron Microscopy;2002-12-04
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