AFM‐Based Spin‐Exchange Microscopy Using Chiral Molecules-Reference-Cited by-同舟云学术

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AFM‐Based Spin‐Exchange Microscopy Using Chiral Molecules

Published:2019-08-18 Issue:40 Volume:31 Page:1904206
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Ziv Amir¹²^ORCID,Saha Abhijit²³,Alpern Hen¹²,Sukenik Nir¹²,Baczewski Lech Tomasz⁴,Yochelis Shira¹²,Reches Meital²³,Paltiel Yossi¹²^ORCID

Affiliation:

1. Applied Physics DepartmentThe Hebrew University of Jerusalem Jerusalem 9190401 Israel

2. Center for Nanoscience and NanotechnologyThe Hebrew University of Jerusalem Jerusalem 9190401 Israel

3. Institute of ChemistryThe Hebrew University of Jerusalem Jerusalem 9190401 Israel

4. Magnetic Heterostructures LaboratoryInstitute of Physics, Polish Academy of Sciences Al. Lotnikow 32/46 02‐668 Warszawa Poland

Funder

Volkswagen Foundation

Israel Science Foundation

John Templeton Foundation

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/adma.201904206

Reference25 articles.

1. Scanning tunneling microscopy—from birth to adolescence

2. Atomic Force Microscope

3. Near Field Scanning Optical Microscopy (NSOM)

4. Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution

5. Observation of vacuum tunneling of spin-polarized electrons with the scanning tunneling microscope

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3. Structural and Electronic Chirality in Inorganic Crystals: from Construction to Application;Chemistry – A European Journal;2024-05-23

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