A Supercritical Lens Optical Label-Free Microscopy: Sub-Diffraction Resolution and Ultra-Long Working Distance-Reference-Cited by-同舟云学术

A Supercritical Lens Optical Label-Free Microscopy: Sub-Diffraction Resolution and Ultra-Long Working Distance

Published:2016-12-19 Issue:8 Volume:29 Page:1602721
ISSN:0935-9648
Container-title:Advanced Materials
language:en
Short-container-title:Adv. Mater.

Author:

Qin Fei¹,Huang Kun²,Wu Jianfeng¹³,Teng Jinghua²,Qiu Cheng-Wei¹,Hong Minghui¹

Affiliation:

1. Department of Electrical and Computer Engineering; National University of Singapore; 4 Engineering Drive 3 Singapore 117583 Singapore

2. Institute of Materials Research and Engineering; Agency for Science Technology and Research (A*STAR); 2 Fusionopolis Way, Innovis, #08-03 Singapore 138634 Singapore

3. Department of Physics; National University of Singapore; 2 Science Drive 3 Singapore 117542 Singapore

Funder

National Research Foundation Singapore

Agency for Science, Technology and Research

Publisher

Wiley

Subject

Mechanical Engineering,Mechanics of Materials,General Materials Science

Reference34 articles.

1. Principles of Optics

2. Superlenses to overcome the diffraction limit

3. Sub-Diffraction-Limited Optical Imaging with a Silver Superlens

4. Hyperlenses and metalenses for far-field super-resolution imaging

5. Far-Field Optical Hyperlens Magnifying Sub-Diffraction-Limited Objects

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