Raman analysis of amorphous silicon ruthenium thin films embedded with nanocrystals-Reference-Cited by-同舟云学术

Raman analysis of amorphous silicon ruthenium thin films embedded with nanocrystals

Published:2015-05-24 Issue:7 Volume:46 Page:619-623
ISSN:0377-0486
Container-title:Journal of Raman Spectroscopy
language:en
Short-container-title:J. Raman Spectrosc.

Author:

Guo Anran¹,Li Wei¹,Jiang Xiangdong²,Wang Chong¹,Jiang Yadong¹

Affiliation:

1. State Key Laboratory of Electronic Thin Films and Integrated Devices; University of Electronic Science and Technology of China; Chengdu 610054 China

2. School of Optoelectronic Information; University of Electronic Science and Technology of China; Chengdu 610054 China

Funder

National Science Foundation of China

Publisher

Wiley

Subject

Spectroscopy,General Materials Science

Reference20 articles.

1. Prospects of near-field plasmonic absorption enhancement in semiconductor materials using embedded Ag nanoparticles

2. Rare earth ions doped phosphors for improving efficiencies of solar cells

3. Band engineering in silicide alloys

4. Electronic properties of isostructural ruthenium and osmium silicides and germanides

5. Electrical and optical characterization of semiconducting Ru2Si3 films and single crystals

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