A survey of digital circuit testing in the light of machine learning
Author:
Affiliation:
1. Advanced Computing and Microelectronics Unit, Indian Statistical Institute Kolkata India
2. Department of Computer Science & Engineering, Indian Institute of Technology Kharagpur Kharagpur India
Publisher
Wiley
Subject
General Computer Science
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/widm.1360
Reference71 articles.
1. Yield learning perspectives
2. Albrecht C.(2005).IWLS 2005 Benchmarks(Tech. Rep.).
3. Automatic Test Equipment (ATE) and Production Test
4. Representation Learning: A Review and New Perspectives
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