Second harmonic generation spectroscopy on Si surfaces and interfaces
Author:
Publisher
Wiley
Subject
Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1002/pssb.200983957/fullpdf
Reference56 articles.
1. Optical characterisation of semiconductor surfaces and interfaces
2. Characterization of semiconductor interfaces by second-harmonic generation
3. Identification of strained silicon layers at Si-SiO2interfaces and clean Si surfaces by nonlinear optical spectroscopy
4. Second-harmonic spectroscopy of interband excitations at the interfaces of strainedSi(100)−Si0.85Ge0.15−SiO2heterostructures
5. Optical studies of Si/SiO 2 interfaces by second-harmonic generation spectroscopy of silicon interband transitions
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1. Second Harmonic Generation Control in 2D Layered Materials: Status and Outlook;Advanced Functional Materials;2024-01-04
2. Second order optical nonlinearity in silicon by symmetry breaking;Applied Physics Reviews;2016-03
3. Interface resonances in optical second-harmonic generation from oxide-covered Ge(111) and Ge(100);Journal of the Optical Society of America B;2013-09-30
4. Quadrupolar second-harmonic generation by helical beams and vectorial vortices with radial or azimuthal polarization;Physical Review A;2013-08-07
5. Blue-shift of E2 critical point resonance in optical second-harmonic spectrum of Si nanocrystals;physica status solidi (b);2012-02-24
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