Spectroscopic reflectometry as in-operando method for thickness determination of anodic oxide films on titanium-Reference-Cited by-同舟云学术

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Spectroscopic reflectometry as in-operando method for thickness determination of anodic oxide films on titanium

Published:2013-03-21 Issue:8 Volume:45 Page:1247-1251
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Schneider M.¹,Langklotz U.²,Michaelis A.¹²

Affiliation:

1. Fraunhofer IKTS; Winterbergstr. 28 01277 Dresden FRG

2. TU Dresden, Inst. of Material Science; Helmholtzstr.7 01067 Dresden FRG

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1002/sia.5262/fullpdf

Reference20 articles.

1. Behavior and Nature of Thin Oxide Films on Some Metals in Gaseous Media and in Electrolyte Solutions

2. K. Kluger Stationäre und instationäre Untersuchungen der Ionenleitfähigkeit von Ventilmetalloxidschichten 1993

3. Stability, reactivity and breakdown of passive films. Problems of recent and future research

4. Formation of crystalline titanium dioxide on barrier layer-forming metals in aqueous electrolytes by anodic spark deposition—first mechanistic conceptions

5. TiO2-Nanoröhren mit hohem Aspektverhältnis durch Anodisieren von Ti

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Micro-electrochemical investigation of the passive behavior of thin anodic titanium oxide films on TiAlV6-4;Materials and Corrosion;2018-07-06

2. Thickness determination of electrochemical titanium oxide (Ti/TiO2) formed in HClO4 solutions;Electrochimica Acta;2014-05

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