Quantitative X-ray microanalysis of thin foils in STEM-Reference-Cited by-同舟云学术

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Quantitative X-ray microanalysis of thin foils in STEM

Published:1986-04 Issue:2 Volume:15 Page:121-129
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Voice W. E.,Bradshaw T. J.,Faulkner R. G.

Publisher

Wiley

Subject

Spectroscopy

Reference24 articles.

1. Electron Microprobe Analysis, Cambridge University Press (1975).

2. NBS Special P;Powell,1976

3. and Tube Investments Res. Rep. No. 303 (1971).

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. The secondary fluorescence correction for X-ray microanalysis in the analytical electron microscope;Journal of Microscopy;1995-06

2. Analytical electron microscopy of thin segregated layers;X-Ray Spectrometry;1994-09

3. Comparative STEM and FEGSTEM analysis of grain boundaries in steels;Materials Characterization;1990-07

4. Investigations towards optimizing EDS analysis by the Cliff-Lorimer method in scanning transmission electron microscopy;X-Ray Spectrometry;1988-10

5. Quantitative energy dispersive x-ray micro-analysis of thin metal specimens using the STEM;Scanning;1987

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