1. and Electron Beam Analysis, ASTM STP. 506, 1972.
2. et al, in (Ed.), Proceedings of 5th International Congress on X-ray Optics and Micro analysis, Springer-Verlag, Tübingen, 1968, pp. 146 to 150.
3. Quantitative X-Ray Microanalysis by E. D. X. on EEM, CNAM Thesis-note CEA. N.1698-March 1974.