Improved model for the intensity of low-energy tailing in Si(Li) x-ray spectra-Reference-Cited by-同舟云学术

Improved model for the intensity of low-energy tailing in Si(Li) x-ray spectra

Published:1991-08 Issue:4 Volume:20 Page:191-197
ISSN:0049-8246
Container-title:X-Ray Spectrometry
language:en
Short-container-title:X-Ray Spectrom.

Author:

Campbell J. L.,Wang J.-X.

Publisher

Wiley

Subject

Spectroscopy

Reference16 articles.

1. State-of-the-art efficiency determination for a Si(Li) X-ray detector in the 3–40 keV energy range

2. Monte Carlo simulation of the response of Si(Li) X-ray detectors to proton induced K X-rays of light elements (12 ≦ Z ≦ 32) applied to efficiency determination

3. Some aspects of detectors and electronics for X-ray fluorescence analysis

4. Entrance Windows in Germanium Low-Energy X-Ray Detectors

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