ToF-SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams-Reference-Cited by-同舟云学术

ToF-SIMS analysis of diadenosine triphosphate and didadenosine tetraphosphate using bismuth and argon cluster ion beams

Author:

Shon Hyun Kyong¹,Cho Young-Lai¹²,Lim Choung Su¹³,Choi Joon Sig³,Chung Sang J.²,Lee Tae Geol¹

Affiliation:

1. Center for Nano-Bio Convergence; Korea Research Institute of Standards and Science; Daejeon 305-340 Republic of Korea

2. Department of Chemistry; Dongguk University; Seoul 100-715 Republic of Korea

3. Department of Biochemistry; Chungnam National University; Daejeon 305-764 Republic of Korea

Funder

NRF

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Link

Reference11 articles.

Cited by 5 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

4. Lipid specific molecular ion emission as a function of the primary ion characteristics in TOF-SIMS;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-09