High resolution at low beam energy in the SEM: resolution measurement of a monochromated SEM-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

High resolution at low beam energy in the SEM: resolution measurement of a monochromated SEM

Published:2011-05 Issue:3 Volume:33 Page:147-154
ISSN:0161-0457
Container-title:Scanning
language:en
Short-container-title:Scanning

Author:

Michael Joseph R.

Publisher

Wiley

Subject

Instrumentation,Atomic and Molecular Physics, and Optics

Reference21 articles.

1. Additions of different contributions to the charged particle probe size;Barth;Optik,1996

2. Lithographically defined porous carbon electrodes;Burkel;Small,2009

3. Electron-density distributions in spherically aberrated probes;Cliff;Inst Phys Conf Ser,1983

4. Cathode lens mode of the SEM in materials science;Frank;Mater Transcations,2007

5. Scanning Electron Microscopy and X-ray Microanalysis

Cited by 13 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Design and optimization of a conical electrostatic objective lens of a low-voltage scanning electron microscope for surface imaging and analysis in ultra-high-vacuum environment;Ultramicroscopy;2024-03

2. How Did Low Voltage in the SEM Become the Preferred Route to High Resolution Imaging?;Microscopy and Microanalysis;2023-07-22

3. Scanning Electron Microscopy (SEM);Springer Handbook of Advanced Catalyst Characterization;2023

4. Low-voltage SEM of air-sensitive powders: From sample preparation to micro/nano analysis with secondary electron hyperspectral imaging;Micron;2022-05

5. The characterization of self-assembled nanostructures in whole blood;Analytical Methods;2020

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP