Reliable estimation of Raman shift and its uncertainty for a non‐doped Si substrate (NMIJ CRM 5606‐a)
Author:
Affiliation:
1. National Metrology Institute of Japan (NMIJ), National Institute of Advanced Industrial Science and Technology (AIST) Japan
Publisher
Wiley
Subject
Spectroscopy,General Materials Science
Link
https://onlinelibrary.wiley.com/doi/pdf/10.1002/jrs.6003
Reference20 articles.
1. Raman Spectroscopy for Chemical Analysis
2. Handbook of Raman Spectroscopy
3. Baseline Assessment for the Consistency of Raman Shifts Acquired with 26 Different Raman Systems and Necessity of a Standardized Calibration Protocol
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