Quantitative surface analysis of FeNi alloy films by XPS, AES and SIMS-Reference-Cited by-同舟云学术

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Quantitative surface analysis of FeNi alloy films by XPS, AES and SIMS

Published:2007 Issue:8 Volume:39 Page:665-673
ISSN:0142-2421
Container-title:Surface and Interface Analysis
language:en
Short-container-title:Surf. Interface Anal.

Author:

Kim K. J.,Moon D. W.,Park C. J.,Simons D.,Gillen G.,Jin H.,Kang H. J.

Publisher

Wiley

Subject

Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics,General Chemistry

Reference25 articles.

1. Intercomparison of silicon dioxide thickness measurements made by multiple techniques: The route to accuracy

2. Critical review of the current status of thickness measurements for ultrathin SiO2 on Si Part V: Results of a CCQM pilot study

3. ISS measurement of surface composition of Au-Cu alloys by simultaneous ion bombardments with Ar+ and He+ ions

4. NiCo alloy as a new reference material for quantitative surface analysis

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