Comparative Study on the Gate‐Induced Electrical Instability of p‐Type SnO Thin‐Film Transistors with SiO 2 and Al 2 O 3 /SiO 2 Gate Dielectrics-Reference-Cited by-同舟云学术

Comparative Study on the Gate‐Induced Electrical Instability of p‐Type SnO Thin‐Film Transistors with SiO 2 and Al 2 O 3 /SiO 2 Gate Dielectrics

Published:2020-08-02 Issue:10 Volume:14 Page:2000304
ISSN:1862-6254
Container-title:physica status solidi (RRL) – Rapid Research Letters
language:en
Short-container-title:Phys. Status Solidi RRL

Author:

Jang Younjin¹,Kim Jun Shik¹,Kang Sukin¹,Kim Jihun¹,Lee Yonghee¹,Kim Kwangmin²,Kim Whayoung¹,Choi Heenang³,Kim Nayeon³,Eom Taeyong³,Chung Taek-Mo³,Jeon Woojin⁴,Lee Sang Yoon⁵,Hwang Cheol Seong¹^ORCID

Affiliation:

1. Department of Materials Science and Engineering Inter-University Semiconductor Research Center Seoul National University Seoul 08826 Republic of Korea

2. Graduate School of Engineering Practice Seoul National University Seoul 08826 Republic of Korea

3. Thin Film Materials Research Center Korea Research Institute of Chemical Technology Daejeon 34114 Republic of Korea

4. Department of Advanced Materials Engineering for Information and Electronics Kyung Hee University Yongin 17104 Republic of Korea

5. Department of Materials Science and Engineering Seoul National University Seoul 08826 Republic of Korea

Funder

Samsung Advanced Institute of Technology

National Research Foundation of Korea

Publisher

Wiley

Subject

Condensed Matter Physics,General Materials Science

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1002/pssr.202000304

Reference20 articles.

1. Complementary Integrated Circuits Based on n-Type and p-Type Oxide Semiconductors for Applications Beyond Flat-Panel Displays

2. Transparent SnO-SnO2p-n Junction Diodes for Electronic and Sensing Applications

3. Hybrid van der Waals SnO/MoS2 Heterojunctions for Thermal and Optical Sensing Applications

4. Pathway to oxide photovoltaics via band-structure engineering of SnO

5. P-Type SnO Thin Film Phototransistor with Perovskite-Mediated Photogating

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