Oxide Nanolayers in Stratified Samples Studied by X-Ray Resonant Raman Scattering at Grazing Incidence
Author:
Affiliation:
1. Facultad de Matemática Astronomía y Física, Universidad Nacional de Córdoba, 5000 Córdoba, Argentina
2. CONICET, Argentina
3. Laboratorio Nacional de Luz Síncrotron, CP 6192, 13084-971 Campinas, Brazil
Abstract
Publisher
Hindawi Limited
Subject
Spectroscopy,Atomic and Molecular Physics, and Optics,Analytical Chemistry
Link
http://downloads.hindawi.com/journals/jspec/2015/618279.pdf
Reference34 articles.
1. Surface Studies of Solids by Total Reflection of X-Rays
2. X-Ray Scattering from Soft-Matter Thin Films
3. Synchrotron radiation excited x-ray fluorescence analysis using total reflection of x-rays
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