High resolution mapping of strains and rotations using electron backscatter diffraction
Author:
Publisher
Informa UK Limited
Subject
Mechanical Engineering,Mechanics of Materials,Condensed Matter Physics,General Materials Science
Link
http://www.tandfonline.com/doi/pdf/10.1179/174328406X130966
Reference22 articles.
1. Electron backscatter diffraction of grain and subgrain structures - resolution considerations
2. A new method for determining small misorientations from electron back scatter diffraction patterns
3. Problems in determining the misorientation axes, for small angular misorientations, using electron backscatter diffraction in the SEM
4. The characterization of low-angle boundaries by EBSD
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