Role of SPS in chloride ions and PEG additive system for copper electrocrystallisation
Author:
Publisher
Informa UK Limited
Subject
Metals and Alloys,Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics
Link
http://www.tandfonline.com/doi/pdf/10.1179/174591910X12692576434572
Reference26 articles.
1. Curvature enhanced adsorbate coverage mechanism for bottom-up superfilling and bump control in damascene processing
2. Additive Behavior during Copper Electrodeposition in Solutions Containing Cl[sup −], PEG, and SPS
3. Effects of Additives on Copper Electrodeposition in Submicrometer Trenches
4. The chemistry of additives in damascene copper plating
5. Damascene copper electroplating for chip interconnections
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