Investigation of 1200 V 4H-SiC Junction Barrier Schottky Diode with Built-in MOSFET

Author:

Lei Yingying1,Wu Yu1,Zhou Xintian1,Liu Meng1,Li Xinyu1,Fang Xingyu1,Zhao Kai1,Zhong Zheng1

Affiliation:

1. Beijing University of Technology, Beijing, China

Publisher

ACM

Reference15 articles.

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2. H. Okumura , "Power electronics innovation by Silicon Carbide power semiconductor devices," 2014 IEEE International Meeting for Future of Electron Devices , Kansai (IMFEDK) , Kyoto , 2014 , pp. 1 -- 2 , doi: 10.1109/IMFEDK.2014.6867086. 10.1109/IMFEDK.2014.6867086 H. Okumura, "Power electronics innovation by Silicon Carbide power semiconductor devices," 2014 IEEE International Meeting for Future of Electron Devices, Kansai (IMFEDK), Kyoto, 2014, pp. 1--2, doi: 10.1109/IMFEDK.2014.6867086.

3. K. Domasevich , V. Nelayev , V. Solodukha and A. Turtsevich , " Comparative analysis of modern schottky diode structures. Design and application issues," 2013 12th International Conference on the Experience of Designing and Application of CAD Systems in Microelectronics (CADSM) , Polyana Svalyava , 2013 , pp. 84 -- 86 . K. Domasevich, V. Nelayev, V. Solodukha and A. Turtsevich, "Comparative analysis of modern schottky diode structures. Design and application issues," 2013 12th International Conference on the Experience of Designing and Application of CAD Systems in Microelectronics (CADSM), Polyana Svalyava, 2013, pp. 84--86.

4. Nuruzzaman M , Islam M A , Alam M A , Structural, elastic and electronic properties of 2H- and 4H-SiC[J] . International Journal of Engineering Research and Applications , 2015 . Nuruzzaman M, Islam M A, Alam M A, et al. Structural, elastic and electronic properties of 2H- and 4H-SiC[J]. International Journal of Engineering Research and Applications, 2015.

5. Dahlquist F , Svedberg J O , Zetterling C M , , Forward Drop JBS Diode with Low Leakage[J]. Mater Sci Forum , 2000 . Dahlquist F, Svedberg J O, Zetterling C M, et al. A 2.8kV, Forward Drop JBS Diode with Low Leakage[J]. Mater Sci Forum, 2000.

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