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2. R. Baburske , J. Luts , H.-J. Shulze and F.-J. Niedernstheide , " Analysis of the Destruction Mechanism during Reverse Recovery of Power Diodes ," Proc. ISPS'10 , 2010 . R. Baburske, J. Luts, H.-J. Shulze and F.-J. Niedernstheide, "Analysis of the Destruction Mechanism during Reverse Recovery of Power Diodes," Proc. ISPS'10, 2010.
3. H.-J. Schulze , J. G. Bauer , F.-J. Niedernostheide , H.-P. Felsl , J. Biermann , J. Lutz , and R. Baburske , " Filament-induced thermomigration of an aluminum drop at the cathode-side of high-voltage power diodes," in Proc . ISPSD , 2011 , pp. 104 -- 107 . H.-J. Schulze, J. G. Bauer, F.-J. Niedernostheide, H.-P. Felsl, J. Biermann, J. Lutz, and R. Baburske, "Filament-induced thermomigration of an aluminum drop at the cathode-side of high-voltage power diodes," in Proc. ISPSD, 2011, pp. 104--107.
4. Cathode-Side Current Filaments in High-Voltage Power Diodes Beyond the SOA Limit
5. K. Nakamura , F. Masuoka , A. Nishii , K. Sadamatsu , S. Kitajima and K. Hatade , " Advanced RFC Technology with New Cathode Structure of Field Limiting Rings for High Voltage Planar Diode," in Proc . ISPSD , 2010 , pp. 133 -- 136 . K. Nakamura, F. Masuoka, A. Nishii, K. Sadamatsu, S. Kitajima and K. Hatade, "Advanced RFC Technology with New Cathode Structure of Field Limiting Rings for High Voltage Planar Diode," in Proc. ISPSD, 2010, pp. 133--136.