Use of the LRU stack depth distribution for simulation of paging behavior

Author:

Turner Rollins1,Strecker Bill1

Affiliation:

1. Digital Equipment Corp., Maynard, MA

Abstract

Two families of probability distributions were needed for use by a virtual memory simulation model: headway between page fault distributions, and working set size distributions. All members of both families can be derived from the LRU stack depth distribution. Simple expressions for the computation of both kinds of distributions are given. Finally, examples are given of both families of distributions as computed from a published stack depth distribution.

Publisher

Association for Computing Machinery (ACM)

Subject

General Computer Science

Cited by 14 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Online Working Set Change Detection with Constant Complexity;The International Symposium on Memory Systems;2021-09-27

2. Optimal eviction policies for stochastic address traces;Theoretical Computer Science;2013-11

3. LUMPABILITY IN LRU STACK WITH MARKOVIAN PAGE REFERENCES;Journal of the Operations Research Society of Japan;1998

4. Expected I-cache miss rates via the gap model;ACM SIGARCH Computer Architecture News;1994-04

5. A New Method for Computing Page-Fault Rates;SIAM Journal on Computing;1993-12

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