Determination of a new formula for the electrical fast transient / burst waveform using genetic algorithm
Author:
Affiliation:
1. National Technical University of Athens, School of Electrical and Computer Engineering, 9, Irron Politecniou Str., GR 15780, Zografou Campus, Athens, Greece, +302107723603, +302107723539, +302107723582
Publisher
ACM
Link
https://dl.acm.org/doi/pdf/10.1145/2903220.2903259
Reference15 articles.
1. Teseq Transient Immunity Testing handy guide Technical report 691-194A December 2008. Teseq Transient Immunity Testing handy guide Technical report 691-194A December 2008.
2. IEC 61000-4-4: 2012 Edition 3 - Electromagnetic Compatibility (EMC) - Part 4.4: Testing and Measurement Techniques - Electrical Fast Transient/Burst Immunity Test. IEC 61000-4-4: 2012 Edition 3 - Electromagnetic Compatibility (EMC) - Part 4.4: Testing and Measurement Techniques - Electrical Fast Transient/Burst Immunity Test.
3. Electrical fast transient (EFT) testing-an overview
4. Immunity to electrical fast transient pulses of computer systems
5. Electrical fast-transient test: conducted and radiated disturbance determination by a complete source modeling
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