Fault Diagnosis for Test Alarms in Microservices through Multi-source Data

Author:

Zhang Shenglin1ORCID,Zhu Jun2ORCID,Hao Bowen2ORCID,Sun Yongqian3ORCID,Nie Xiaohui4ORCID,Zhu Jingwen2ORCID,Liu Xilin5ORCID,Li Xiaoqian5ORCID,Ma Yuchi5ORCID,Pei Dan6ORCID

Affiliation:

1. Nankai University, Tianjin, China / Haihe Laboratory of Information Technology Application Innovation, Tianjin, China

2. Nankai University, Tianjin, China

3. Nankai University, Tianjin, China / Tianjin Key Laboratory of Software Experience and Human Computer Interaction, Tianjin, China

4. Computer Network Information Center at Chinese Academy of Sciences, Beijing, China

5. Huawei Technologies, Shenzhen, China

6. Tsinghua University, Beijing, China / BNRist, Beijing, China

Funder

National Natural Science Foundation of China

Publisher

ACM

Reference53 articles.

1. Nuha Alshuqayran, Nour Ali, and Roger Evans. 2016. A systematic mapping study in microservice architecture. In 2016 IEEE 9th International Conference on Service-Oriented Computing and Applications (SOCA). 44–51.

2. Mining Historical Test Logs to Predict Bugs and Localize Faults in the Test Logs

3. Mihael Ankerst, Markus M Breunig, Hans-Peter Kriegel, and Jörg Sander. 1999. OPTICS: Ordering points to identify the clustering structure. ACM Sigmod record, 28, 2 (1999), 49–60.

4. Jonathan Bell, Owolabi Legunsen, Michael Hilton, Lamyaa Eloussi, Tifany Yung, and Darko Marinov. 2018. DeFlaker: Automatically detecting flaky tests. In Proceedings of the 40th international conference on software engineering. 433–444.

5. Exploring better black-Box test case prioritization via log analysis;Chen Zhichao;ACM Transactions on Software Engineering and Methodology,2023

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