DynaPAT-Reference-Cited by-同舟云学术

DynaPAT

Published:2022-10-30 Issue: Volume: Page:
ISSN:
Container-title:Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design
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Author:

Nguyen Thai-Hoang¹,Imran Muhammad²,Yang Joon-Sung³

Affiliation:

1. Sungkyunkwan University, Suwon, South Korea

2. National University of Sciences and Technology, Islamabad, Pakistan

3. Yonsei University, Seoul, South Korea

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3508352.3549400

Reference30 articles.

1. A 6-bit drift-resilient readout scheme for multi-level Phase-Change Memory

2. I. Boybat , S. R. Nandakumar , M. Le Gallo , B. Rajendran , Y. Leblebici , A. Sebastian , and E. Eleftheriou . 2018. Impact of conductance drift on multi-PCM synaptic architectures . In 2018 Non-Volatile Memory Technology Symposium (NVMTS). IEEE, 1--4. I. Boybat, S. R. Nandakumar, M. Le Gallo, B. Rajendran, Y. Leblebici, A. Sebastian, and E. Eleftheriou. 2018. Impact of conductance drift on multi-PCM synaptic architectures. In 2018 Non-Volatile Memory Technology Symposium (NVMTS). IEEE, 1--4.

3. Accelerator-friendly neural-network training: Learning variations and defects in RRAM crossbar

4. Zihang Dai , Hanxiao Liu , Quoc V Le , and Mingxing Tan . 2021. CoAtNet: Marrying Convolution and Attention for All Data Sizes. arXiv preprint arXiv:2106.04803 ( 2021 ). Zihang Dai, Hanxiao Liu, Quoc V Le, and Mingxing Tan. 2021. CoAtNet: Marrying Convolution and Attention for All Data Sizes. arXiv preprint arXiv:2106.04803 (2021).

5. An overview of phase-change memory device physics;Gallo Manuel Le;IOP Publishing,2020

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2. CRAFT: Criticality-Aware Fault-Tolerance Enhancement Techniques for Emerging Memories-Based Deep Neural Networks;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-10