Efficient SRAM failure rate prediction via Gibbs sampling

Author:

Dong Changdao,Li Xin

Publisher

ACM Press

Cited by 8 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. An efficient Bayesian yield estimation method for high dimensional and high sigma SRAM circuits;Proceedings of the 55th Annual Design Automation Conference;2018-06-24

2. An Efficient Non-Gaussian Sampling Method for High Sigma SRAM Yield Analysis;ACM Transactions on Design Automation of Electronic Systems;2018-04-18

3. Efficient transistor-level timing yield estimation via line sampling;Proceedings of the 53rd Annual Design Automation Conference;2016-06-05

4. Hyperspherical Clustering and Sampling for Rare Event Analysis with Multiple Failure Region Coverage;Proceedings of the 2016 on International Symposium on Physical Design;2016-04-03

5. Efficient Aging-Aware SRAM Failure Probability Calculation via Particle Filter-Based Importance Sampling;IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences;2016

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