1. Experimental realization of electromigration at high power for copper wires;Journal of Energy Systems;2019-12-31
2. Modeling the impact of fundamental and quantum resistance on the performance of SWCNT‐based RLC interconnects;International Journal of Numerical Modelling: Electronic Networks, Devices and Fields;2019-11-06
3. Electromigration Analysis of VLSI Circuits Using the Finite Element Method;VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things;2019
4. Mitigating Electromigration in Physical Design;Fundamentals of Electromigration-Aware Integrated Circuit Design;2018
5. Fundamentals of Electromigration;Fundamentals of Electromigration-Aware Integrated Circuit Design;2018