Quantum Measurement Classification Using Statistical Learning

Abstract

Interpreting the results of a quantum computer can pose a significant challenge due to inherent noise in these mesoscopic quantum systems. Quantum measurement, a critical component of quantum computing, involves determining the probabilities linked with quantum states post-multiple circuit computations based on quantum readout values provided by hardware. While there are promising classification-based solutions, they can either misclassify or necessitate excessive measurements, thereby proving to be costly. This article puts forth an efficient method to discern the quantum state by analyzing the probability distributions of data post-measurement. Specifically, we employ cumulative distribution functions to juxtapose the measured distribution of a sample against the distributions of basis states. The efficacy of our approach is demonstrated through experimental results on a superconducting transmon qubit architecture, which shows a substantial decrease (88%) in single qubit readout error compared to state-of-the-art measurement techniques. Moreover, we report additional error reduction (12%) compared to state-of-the-art measurement techniques when our technique is applied to enhance existing multi-qubit classification techniques. We also demonstrate the applicability of our proposed method for higher dimensional quantum systems, including classification of single qutrits as well as multiple qutrits.