Non-enumerative Generation of Path Delay Distributions and Its Application to Critical Path Selection
Author:
Affiliation:
1. Southern Illinois University, Carbondale, IL
2. Intel Corporation, Folsom, CA
3. Intel Corporation, Austin, TX
Abstract
Funder
NSF I/UCRC for Embedded Systems at SIUC
Publisher
Association for Computing Machinery (ACM)
Subject
Electrical and Electronic Engineering,Computer Graphics and Computer-Aided Design,Computer Science Applications
Link
https://dl.acm.org/doi/pdf/10.1145/2940327
Reference24 articles.
1. Statistical Timing Analysis: From Basic Principles to State of the Art
2. Testability-Driven Statistical Path Selection
3. Test Path Selection for Capturing Delay Failures Under Statistical Timing Model
Cited by 2 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. A Cross-level Verification Methodology for Digital IPs Augmented with Embedded Timing Monitors;ACM Transactions on Design Automation of Electronic Systems;2019-05-31
2. Efficient Critical Path Selection Under a Probabilistic Delay Model;Proceedings of the on Great Lakes Symposium on VLSI 2017;2017-05-10
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