The best of both worlds: integrating semantic features with expert features for defect prediction and localization-Reference-Cited by-同舟云学术

The best of both worlds: integrating semantic features with expert features for defect prediction and localization

Published:2022-11-07 Issue: Volume: Page:
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Container-title:Proceedings of the 30th ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering
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Author:

Ni Chao¹,Wang Wei¹,Yang Kaiwen¹,Xia Xin²,Liu Kui²,Lo David³

Affiliation:

1. Zhejiang University, China

2. Huawei, China

3. Singapore Management University, Singapore

Funder

the National Natural Science Foundation of China

the Natural Science Foundation of Jiangsu Province, China

the Key Research and Development Program of Zhejiang Province

the Open Project Program of the State Key Laboratory of Mathematical Engineering and Advanced Computing

Publisher

ACM

Link

https://dl.acm.org/doi/pdf/10.1145/3540250.3549165

Reference66 articles.

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3. Tom Britton Lisa Jeng Graham Carver Paul Cheak and Tomer Katzenellenbogen. 2013. Reversible debugging software. Technique Report in University of Cambridge. Tom Britton Lisa Jeng Graham Carver Paul Cheak and Tomer Katzenellenbogen. 2013. Reversible debugging software. Technique Report in University of Cambridge.

4. Class Imbalance Evolution and Verification Latency in Just-in-Time Software Defect Prediction

5. Software defect number prediction: Unsupervised vs supervised methods

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