Direct micro-imaging of point defects in bulk SiO 2 , applied to vacancy diffusion and clustering-Reference-Cited by-同舟云学术

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Direct micro-imaging of point defects in bulk SiO 2 , applied to vacancy diffusion and clustering

Published:2010-04-01 Issue:2 Volume:90 Page:26009
ISSN:0295-5075
Container-title:EPL (Europhysics Letters)
language:
Short-container-title:EPL

Author:

Suhovoy E.,Mishra V.,Shklyar M.,Shtirberg L.,Blank A.

Publisher

IOP Publishing

Subject

General Physics and Astronomy

Link

https://iopscience.iop.org/article/10.1209/0295-5075/90/26009/pdf

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Harnessing Electron Spin Hyperpolarization in Chromophore–Radical Spin Probes for Subcellular Resolution in Electron Paramagnetic Resonance Imaging: Concept and Feasibility;The Journal of Physical Chemistry B;2022-03-30

2. Electron paramagnetic resonance imaging for real-time monitoring of Li-ion batteries;Nature Communications;2015-02-09

3. New approach for measuring migration properties of point defects in amorphous oxides;physica status solidi (a);2014-06-02

4. Emission Mechanisms of Si Nanocrystals and Defects in SiO2Materials;Journal of Nanomaterials;2014

5. Effect of segregation on other physicochemical processes in implanted layers;Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques;2012-09

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