Author:
DeOrio Andrew,Li Qingkun,Burgess Matthew,Bertacco Valeria
Publisher
IEEE Conference Publications
Cited by
7 articles.
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1. Experts in the Loop: Conditional Variable Selection Based on Deep Learning for Accelerating Post-Silicon Validation;IEEE Transactions on Semiconductor Manufacturing;2024-05
2. A Simple Confidence-Supervised Model for High-Resolution Defect Recognition;2024 8th International Conference on Robotics, Control and Automation (ICRCA);2024-01-12
3. A Comprehensive Review of Machine Learning Applications in VLSI Testing: Unveiling the Future of Semiconductor Manufacturing;2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech);2023-12-18
4. Interactive Analysis of Post-Silicon Validation Data;2022 First International Workshop on Visualization in Testing of Hardware, Software, and Manufacturing (TestVis);2022-10
5. Adaptive Feedback Mechanism for Silicon Bug Detection;Lecture Notes in Electrical Engineering;2021