Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever-Reference-Cited by-同舟云学术

Surface Potential Investigation of Fullerene Derivative Film on Platinum Electrode under UV Irradiation by Kelvin Probe Force Microscopy Using a Piezoelectric Cantilever

Published:2015 Issue:0 Volume:13 Page:102-106
ISSN:1348-0391
Container-title:e-Journal of Surface Science and Nanotechnology
language:en
Short-container-title:e-J. Surf. Sci. Nanotech.

Author:

Satoh Nobuo¹,Katori Shigetaka¹,Kobayashi Kei²,Watanabe Shunji³,Fujii Toru³,Matsushige Kazumi¹,Yamada Hirofumi¹

Affiliation:

1. Department of Electronic Science and Engineering, Kyoto University

2. The Hakubi Center for Advanced Research, Kyoto University

3. Nikon Corporation

Publisher

Surface Science Society Japan

Subject

Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology

Reference27 articles.

1. [1] C. F. Quate, Jpn. J. Appl. Phys. 42, 4777 (2003).

2. [2] F. J. Giessibl, Science 267, 68 (1995).

3. [3] M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991).

4. [4] T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991).

5. [5] H. Yamada, T. Fukuma, K. Umeda, K. Kobayashi, and K. Matsushige, Appl. Surf. Sci. 188, 391 (2002).

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Development of atomic force microscopy combined with scanning electron microscopy for investigating electronic devices;AIP Advances;2019-11-01

2. Nanoscale investigation of bulk heterojunction organic solar cell by scanning capacitance force microscopy;Japanese Journal of Applied Physics;2018-07-11

3. Investigation of the depletion layer by scanning capacitance force microscopy with Kelvin probe force microscopy;Japanese Journal of Applied Physics;2016-07-08