An Algorithm to Correct the Sensitivity Distribution of a Retarding Field Analyzer for Photoelectron Holography
Author:
Affiliation:
1. Division of Material Science, Nara Institute of Science and Technology
2. Faculty of Science and Engineering, Kindai University
3. Program on Smart Sustainable Manufacturing, National Cheng Kung University
Publisher
Surface Science Society Japan
Subject
Surfaces, Coatings and Films,Surfaces and Interfaces,Mechanics of Materials,Condensed Matter Physics,Bioengineering,Biotechnology
Link
https://www.jstage.jst.go.jp/article/ejssnt/21/3/21_2023-027/_pdf
Reference25 articles.
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3. [3] M. Tegze and G. Faigel, EPL 16, 41 (1991).
4. [4] M. Tegze and G. Faigel, Nature 380, 49 (1996).
5. [5] L. Cser, Gy. Török, G. Krexner, I. Sharkov, and B. Faragó, Phys. Rev. Lett. 89, 175504 (2002).
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