Percolation Phenomena in Cux(SiOy)100-xNanocomposite Films Produced by Ion Beam-Sputtering
Author:
Affiliation:
1. Department of Electrical Devices and High Voltage Technology, Lublin University of Technology, Nadbystrzycka 38a, 20-618 Lublin, Poland
2. Belarusian State University, 4 Nezavisimosti Av., 220030, Minsk, Belarus
Publisher
Institute of Physics, Polish Academy of Sciences
Subject
General Physics and Astronomy
Cited by 7 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Oxygen Impurity-Tuned Structure and Adhesion Properties of the Cu/SiO2 Interface;ACS Applied Materials & Interfaces;2024-04-20
2. Analysis of Uneven Distribution of Nodes Creating a Percolation Channel in Matrices with Translational Symmetry for Direct Current;Energies;2023-11-18
3. AC Dependence of Electrical Properties of SiOx/ZrO2 Multilayer Nanocomposites with Si Nanocrystals;Lecture Notes in Mechanical Engineering;2019
4. Quantum phenomena in metallic phase nanoparticles;Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies IX;2018-12-31
5. AC dielectric properties of SiO2 thin layers implanted with In and Sb ions;Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018;2018-10-01
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