1. Chang , T. H. P. Nixon , W. C. 1966a Electron beam machining of silicon observed with the scanning electron microscope
2. Chang , T. H. P. Nixon , W. C. 1966b Scanning electron microscopy and electron beam effects on silicon surfaces
3. Electron beam induced potential contrast on unbiased planar transistors;Chang;Solid State Electronics,1967
4. Deflection modulation CRT display;Everhart;Proc. Inst, of Elec. Engineers,1966
5. Non-laminar electron beams in high magnetic fields;Johnston;Proc. Inst. of Elec. Engineers, London,1958