Optimization of PST Thin Films Grown by Sputtering and Complete Dielectric Performance Evaluation: An Alternative Material for Tunable Devices-Reference-Cited by-同舟云学术

Optimization of PST Thin Films Grown by Sputtering and Complete Dielectric Performance Evaluation: An Alternative Material for Tunable Devices

Published:2011-06-24 Issue:12 Volume:94 Page:4323-4328
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J. Am. Ceram. Soc.

Author:

Lei Xiuyun¹,Rémiens Denis²,Ponchel Freddy²,Soyer Caroline²,Wang Genshui¹,Dong Xianlin¹

Affiliation:

1. Key Laboratory of Inorganic Functional Materials and Devices; Shanghai Institute of Ceramics; Chinese Academy of Sciences; 1295 Dingxi Road; Shanghai; 200050; China

2. Institute of Electronics; Microelectronics and Nanotechnology (IEMN) - DOAE; UMR CNRS 8520; Université des Sciences et Technologies de Lille; 59652; Villeneuve d'Ascq Cedex; France

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1551-2916.2011.04683.x/fullpdf

Reference23 articles.

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