Preface to StSPM2019EV special issue-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Preface to StSPM2019EV special issue

Published:2020-11-12 Issue:3 Volume:280 Page:181-182
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

ALBONETTI C.¹,VALDRÈ G.²³

Affiliation:

1. Institute for the Study on Nanostructured Materials ISMN National Research Council of Italy (CNR) Bologna Italy

2. Dipartimento di Scienze Biologiche, Geologiche e Ambientali Università di Bologna ‘Alma Mater Studiorum’ Piazza di Porta San Donato 1 Bologna Italy

3. Centro di Ricerca Interdisciplinare di Biomineralogia, Cristallografia e Biomateriali Università di Bologna ‘Alma Mater Studiorum’ Piazza di Porta San Donato 1 Bologna Italy

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12966

Reference10 articles.

1. Quantitative phase‐mode electrostatic force microscopy on silicon oxide nanostructures;Albonetti C.;J. Microsc,2020

2. Atomic force microscopy as an imaging tool to study the bio/nonbio complexes

3. Assessing conformal thin film growth under nonstochastic deposition conditions: application of a phenomenological model of roughness replication to synthetic topographic images;Bontempi M.;J. Microsc,2020

4. Anion intercalated graphite: a combined electrochemical and tribological investigation by in situ AFM;Bussetti G.;J. Microsc,2020

5. 4H‐SiC surface morphology after Al ion implantation and annealing with C‐cap;Canino M.;J. Microsc,2020

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP