Microstructural Evolution of Copper Thick Films Observed by Environmental Scanning Electron Microscopy

Author:

Sample David R.,Brown Paul W.,Dougherty Joseph P.

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Reference18 articles.

1. 2. R. J. Bacher, and V. P. Siuta , "Firing Process-Related Failure in Thick-Film Copper Multilayers ," Proc.-Electron. Compon. Conf., 471 -80 (1986 ).

2. 3. J. B. Bradley , "Copper Thick Film Nitrogen Atmosphere Furnace Design and Firing Process Considerations ," Proc. Int. Microelectron. Symp., 435 -40 (1985 ).

3. 4. C. L. Fisher, D. L. Hankey, E. C. Liang, B. Bertsch, and D. K. Hinkle , "Infrared Firing of a Copper Multilayer System ," Proc. Int. Microelectron. Symp., 259 -67 (1984 ).

4. 5. R. D. Gardner, A. S. Shaikh, G. Sarker, and C. Bauer , "Materials Science Aspects of a Thick Film Copper/Dielectric System ," Proc. Int. Microelectron. Symp., 285 -94 (1990 ).

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