Subsurface Defect Detection in Ceramics Using an Optical Gated Scatter Reflectometer-Reference-Cited by-同舟云学术

Subsurface Defect Detection in Ceramics Using an Optical Gated Scatter Reflectometer

Published:1996-05 Issue:5 Volume:79 Page:1397-1400
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J American Ceramic Society

Author:

Bashkansky Mark,Battle Phillip R.,Duncan Michael D.,Kahn Manfred,Reintjes J.

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

http://onlinelibrary.wiley.com/wol1/doi/10.1111/j.1151-2916.1996.tb08602.x/fullpdf

Reference11 articles.

1. Simple Technique for Observing Subsurface Damage in Machining of Ceramics

2. 5. W. A. Ellingson, D. M. Ayaz, M. P. Brada, and W. O'Connell , "Detection of Subsurface Defects in Machined Silicon Nitride Ceramics by Optical Scattering Methods"; pp. 147 -57 inNIST Special Publication, Vol. 847, Machining of Advanced Materials. National Institute of Standards and Technology, Washington, DC, 1993 .

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