1. 1(a) High Temperature Technology , I. E. Campbell ; pp.491 -500 . John Wiley & Sons, Inc., New York, 1956 . 491 pp.
2. (b)H. P. Klug, and L. E. Alexander , X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials , pp.226 -34 . John Wiley & Sons, Inc., New York, 1951 . 226 pp.Ceram. Abstr., 1951 , p.226 .
3. (c)H. S. Peiser, H. P. Rooksby, and A. J. C. Wilson , X-Ray Diffraction by Polycrystalline Materials , pp.242 -64 . Institute of Physics, London, 1955 . 242 pp.
4. The Precision Determination of Lattice Constants by the Powder and Rotating Crystal Methods and Applications
5. High Temperature X‐Ray Diffraction Camera