High‐quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM-Reference-Cited by-同舟云学术

High‐quality imaging in environmental scanning electron microscopy – optimizing the pressure limiting system and the secondary electron detection of a commercially available ESEM

Published:2015-11-05 Issue:1 Volume:262 Page:85-91
ISSN:0022-2720
Container-title:Journal of Microscopy
language:en
Short-container-title:Journal of Microscopy

Author:

FITZEK H.¹,SCHROETTNER H.¹²,WAGNER J.²,HOFER F.¹²,RATTENBERGER J.²

Affiliation:

1. Institute for Electron Microscopy and Nanoanalysis (FELMI)Graz University of Technology (TU Graz) Steyrergasse 17 8010 Graz Austria

2. Graz Centre for Electron Microscopy (ZFE) Steyrergasse 17 8010 Graz Austria

Publisher

Wiley

Subject

Histology,Pathology and Forensic Medicine

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jmi.12347

Reference18 articles.

1. Foundations of Environmental Scanning Electron Microscopy

2. Danilatos G.D.(1990)Theory of the gaseous detector device in the ESEM.Advances in Electronics and Electron Physics(ed. by Peter W. Hawkes) Vol.78 pp.1–102. Academic Press Boston.

3. Environmental scanning electron microscope‐some critical issues;Danilatos G.D.;Scan. Microscop. Int.,1993

4. Danilatos G.D.(2000) Environmental scanning electron microscope US6809322 B2

5. Optimum beam transfer in the environmental scanning electron microscope

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