The effect of imprint on remanent piezoelectric properties and ferroelectric aging of PbZr 0.52 Ti 0.48 O 3 thin films-Reference-Cited by-同舟云学术

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The effect of imprint on remanent piezoelectric properties and ferroelectric aging of PbZr 0.52 Ti 0.48 O 3 thin films

Published:2019-03-14 Issue:9 Volume:102 Page:5328-5341
ISSN:0002-7820
Container-title:Journal of the American Ceramic Society
language:en
Short-container-title:J Am Ceram Soc

Author:

Akkopru‐Akgun Betul¹²^ORCID,Zhu Wanlin²,Lanagan Michael T.¹³,Trolier‐McKinstry Susan¹²^ORCID

Affiliation:

1. Center for Dielectrics and Piezoelectrics Materials Research Institute The Pennsylvania State University University Park Pennsylvania

2. Department of Materials Science and Engineering The Pennsylvania State University University Park Pennsylvania

3. Department of Engineering Science and Mechanics The Pennsylvania State University University Park Pennsylvania

Funder

National Science Foundation

Publisher

Wiley

Subject

Materials Chemistry,Ceramics and Composites

Link

https://onlinelibrary.wiley.com/doi/pdf/10.1111/jace.16367

Reference48 articles.

1. Thin Film Piezoelectrics for MEMS

2. Piezoelectric actuation of PZT thin-film diaphragms at static and resonant conditions

3. The wafer flexure technique for the determination of the transverse piezoelectric coefficient (d31) of PZT thin films

4. Ferroelectric, dielectric and piezoelectric properties of ferroelectric thin films and ceramics

5. Ferroelectric thin films: Review of materials, properties, and applications

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3. Exploring the Imprint Effect of Oxygen-Deficient Pbtio3thin Films on Energy Storage Characteristics of Ferroelectric Capacitors;2024

4. Exceptional high temperature retention in Al0.93B0.07N films;Applied Physics Letters;2023-06-12

5. Tuning Nb Solubility, Electrical Properties, and Imprint through PbO Stoichiometry in PZT Films;Materials;2023-05-25

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