Patch testing in patients with suspected cosmetic dermatitis: A retrospective study
Author:
Affiliation:
1. Department of Dermatology and STD; Lady Hardinge Medical College; New Delhi India
Publisher
Wiley
Subject
Dermatology
Link
http://onlinelibrary.wiley.com/wol1/doi/10.1111/jocd.12359/fullpdf
Reference17 articles.
1. Cosmetics and Skin Care Products
2. Surveillance of contact allergies: methods and results of the Information Network of Department of Dermatology (IVDK);Schnuch;Allergy,2012
3. Patch testing in suspected allergic contact dermatitis to cosmetics;Kumar;Dermatol Res Pract,2014
4. Comparative study of finn chambers and T.R.U.E. test methodologies in detecting the relevant allergens inducing contact dermatitis;Suneja;J Am Acad Dermatol,2001
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Comparison of the Effects of Domestic and International Pore-Covering Primers Using Digital Imaging;Journal of the Korean Society of Cosmetology;2024-08-31
2. Clinico-epidemiological and Patch Test Profile of Patients with Suspected Allergic Contact Dermatitis to Cosmetics in a Tertiary Care Hospital in the Southern Philippines: A 3-year Retrospective Study;Journal of the Philippine Dermatological Society;2024-05
3. Role of Patch Testing in Facial Contact Dermatitis: A Cross-Sectional Study from Central India;Indian Dermatology Online Journal;2024-02-28
4. Characteristics of Litigations Involving Contact Dermatitis: An Exploratory Analysis;Dermatitis®;2023-10-03
5. Quaternary Ammonium Compounds and Contact Dermatitis: A Review and Considerations During the COVID-19 Pandemic;Clinical, Cosmetic and Investigational Dermatology;2023-06
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3