Repression of Primary Electrons by Mixing the NO or SF6 with N2 Under High Pressure-Reference-Cited by-同舟云学术

Repression of Primary Electrons by Mixing the NO or SF6 with N2 Under High Pressure

Published:2007 Issue:12 Volume:127 Page:777-783
ISSN:0385-4205
Container-title:IEEJ Transactions on Fundamentals and Materials
language:en
Short-container-title:IEEJ Trans. FM

Author:

Kuroki Yuta¹,Yumoto Motoshige¹

Affiliation:

1. Musashi Institute of Technology

Publisher

Institute of Electrical Engineers of Japan (IEE Japan)

Subject

Electrical and Electronic Engineering

Link

http://www.jstage.jst.go.jp/article/ieejfms/127/12/127_12_777/_pdf

Reference10 articles.

1. (1) 次世代送変電機器のガス絶縁方式調査専門委員会:「SF₆の地球環境負荷とSF₆混合.代替ガス絶縁」,電気学会技術報告, No. 841 (2001)

2. (2) M. M. Pejovic, G. S. Ristic, and J. P. Karamarkovic : “Electrical breakdown in low pressure gases”, J. Phys. D: Appl. Phys., Vol. 35, pp. R91-R103 (2002)

3. (3) 「パルスパワー放電の物理とその高度応用研究の動向」,電気学会技術報告, No. 793 (2000)

4. (4) G. V. Samsonov and V. S. Fomenko : HANDBOOK OF THERMIONIC PROPERTIES Electronic Work Functions and Richardson Constants of Element and Compounds (1996)

5. Measurement of Sparkover Voltage and Time Lag Characteristics in SF₆-N₂ Gas Mixtures by using Steep-front Square Voltage

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1. Analysis of Electron Generation Mechanism under Repetition Voltage Application in Nitrogen;IEEJ Transactions on Fundamentals and Materials;2015

2. Decrease of primary electron number by NO, CO2, and SF6 mixing at breakdown in high-pressure nitrogen;Electrical Engineering in Japan;2010-08

3. Primary Electron Supply by Repetitive Discharges under High Pressure Nitrogen -Breakdown Characteristics by Electron Attachment Reaction-;IEEJ Transactions on Fundamentals and Materials;2010

4. Decrease of Primary Electron Number by NO, CO2 and SF6 Mixing at the Breakdown in High Pressure Nitrogen;IEEJ Transactions on Fundamentals and Materials;2008