The Observation of Local Electric Fields in GaN/AlGaN/InGaN Multi-heterostructures by Differential Phase Contrast STEM
Author:
Affiliation:
1. University of Tokyo
2. Sony Group Corporation
3. Japan Fine Ceramics Center
Publisher
Institute of Electrical Engineers of Japan (IEE Japan)
Subject
Electrical and Electronic Engineering
Link
https://www.jstage.jst.go.jp/article/ieejeiss/142/3/142_367/_pdf
Reference26 articles.
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2. (2) S. Morishita, R. Ishikawa, Y. Kohno, H. Sawada, N. Shibata, and Y. Ikuhara : “Attainment of 40.5 pm spatial resolution using 300 kV scanning transmission electron microscope equipped with fifth-order aberration corrector”, Microscopy, Vol. 67, No. 1, pp. 46-50 (2018)
3. (3) H. Rose : “Phase Contrast in Scanning Transmission Electron Microscopy”, Optik, Vol. 39, No. 4. pp. 416-436 (1974)
4. (4) N. H. Dekkers and H. d. Lang : “Differential Phase Contrast in a STEM”, Optik (Stuttg)., Vol. 41, No. 4, pp. 452-456 (1974)
5. (5) J. N. Chapman, I. R. McFadyen, and S. McVitie : “Modified differential phase contrast Lorentz microscopy for improved imaging of magnetic structures”, IEEE Trans. Magn., Vol. 26, No. 5, pp. 1506-1511 (1990)
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