The angular distribution of scattered and sputtered 40-keV particles on polycrystalline targets

Abstract

Based on the hard-sphere potential approximation, angular distributions of scattered particles at different mass ratios M1:M2 were calculated. The results were compared with experiments carried out with the following atoms:[Formula: see text]The sputtered particles from the target as well as from the incident-ion beam were collected on graphite rods and measured by either activation analysis or a radioactive tracer technique.