X-ray Raman scattering on polycrystalline graphite in the scattering angle range 0–120°

Abstract

X-ray Raman scattering was studied on polycrystalline graphite for various scattering angles in the range 0–120°. A mosaic graphite spectrometer without collimators and Crkβ radiation were used.The shape of the Raman spectrum depended slightly on the scattering angle. The peak intensity of the Raman line increases with scattering angle but in a different way to that resulting from the calculation of Mizuno and Ohmura. Additional components were observed in the spectrum on both sides of the Raman line.