Delayed Coincidence Measurement of the Picoseconds Lifetime of the 9.699 MeV (5−) Level of 28Si

Abstract

A description of a measurement of the lifetime of the 9.699 MeV (5−) level of 28Si by our improved self-comparison delayed coincidence method is given. We obtain (8 ± 4) ps. This is consistent with our Doppler shift attenuation method measurement which gives (3.3 ± 0.8) ps, where the quoted error contains no allowance for uncertainties in F(τ). This consistency gives support to the extension of our delayed coincidence measurements into the picoseconds range.